Microcantilever based force tracking with application to high resolution imaging
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16-11-2010, 04:27 PM


Microcantilever based force tracking with application to high resolution imaging
Anoop Ponnari
S-7 AEI
Dept. of electronics and communication
College Of Engineering, Trivandrum
2007-11 Batch


.ppt   microcantilever based force tracking with application to high resolution imaging.ppt (Size: 2.58 MB / Downloads: 42)

Overview
Experiment
Mathemetical modelling
Controller design
Block diagram
Response plots
Applications
Advantages
references

Experiment
Force sensing and control at nanoscale is employed using a NMC.

Piezoresistive NMC is using in this experiment.

Aim is to acquire the force trajectory at the NMC’s tip.

Mathematical modeling and controller design.

Mathematical modeling
Nanostage can be modelled as a mass spring damper system.

Applications

Measure forces at nanoscale.
Predict the change of spring constant caused by surface stress.
Measure DNA hybridization.
Study of adsorption of lipoprotein,antigen-antibody binding.

Advantages

Sensing basedd on NMC is simple,inexpensive and accurate.

Instead of bulky laser beam piezoresistive layer is used for sensing.

Extreme precision.

Conclusion

Developed a real time implementation of robust nonlinear control frame work for piezoresistive NMC based force tracking.
Utilizing MRC PE controller could result in smoother control when compared to commercially avaliable PID controllers.
It significantly enhance the imaging resolution and manipulation accuracy.

References
“nanotechnology”. IEEE Transactions on nanotechnology Vol. 5, No 6, november 2006.
“Microassemblyexperiments under optical vision based control”.IEEE transaction of industrual electronics.Vol 52.No.4,Aug 2005
“Study of data retention of nanocrystal Flash memories”. IEEE International Physics Symposium, April 2003.
“New actuation for push pull electrostatic MEMS comb drive”.IEEE transaction Ind. Electron., Vol50,No.6,Dec 2003


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